JEOL releases new scanning electron microscope

By The Science Advisory Board staff writers

May 26, 2020 -- JEOL has unveiled JSM-IT800, a new Schottky field-emission scanning electron microscope (SEM).

The new microscope features the company's in-lens Schottky Plus field emission electron gun for high-resolution imaging to fast elemental mapping, according to the firm. It also includes SEM Center, a graphical user interface that supports integration of an energy dispersive x-ray spectrometer, JEOL said.

JSM-IT800. Image courtesy of JEOL.

JSM-IT800 is available with either a hybrid lens (HL) for general-purpose use or a super hybrid lens (SHL) for enhanced resolution observation and various analyses, the company said. The SHL edition also comes with an upper hybrid detector (UHD), which produces images with a higher signal-to-noise ratio.

Both the HL and SHL versions can also be equipped with a scintillator backscattered electron detector (SBED) and a versatile backscattered electron detector (VBED), JEOL said.

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