By Samantha Black, Ph.D.

September 19, 2019 -- Thermo Fisher Scientific today introduced the Phenom ParticleX, scanning electron microscope (SEM). The tool is a versatile and intuitive desktop solution designed to additive manufacturing (3D printing) companies faster quality control analyses of materials used in development and production. The Phenom ParticleX package consists of a high-performance Phenom XL Desktop SEM with automation software packages for additive manufacturing and technical cleanliness.

Thermo Scientific Phenom ParticleX

The Phenom ParticleX can be used to automate analyses including: identifying faults in materials and gauging the impact changes have on a final product. This technology will allow companies to keep quality control in house with fast analysis speeds.

"Obtaining timely information is a prerequisite for lean manufacturing and the new automated system in the Phenom ParticleX offers multiple sample analyses, including chemical and morphological classification, outlier detection, and identification of contamination that allow users to validate produced goods against industry-approved standards," said Trisha Rice, vice president and general manager of materials science at Thermo Fisher Scientific. "Fast validation time enables manufacturing companies to meet customer commitments while requiring less inventory."

The Phenom ParticleX delivers high-resolution imaging and chemical analysis with more detailed failure analyses compared to optical microscopes. Additive manufacturers can characterize size distribution, particle homogeneity and foreign contaminants to evaluate the purity of metal particles at the microscale. It also provides detailed feedback on the cleanliness or purity of final product without having to share this confidential and valuable data with third parties.


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